DocumentCode
1880890
Title
Negative material characterization using microstrip line structures
Author
Boybay, Muhammed S. ; Kim, Seunghwan ; Ramahi, Omar M.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2010
fDate
11-17 July 2010
Firstpage
1
Lastpage
4
Abstract
The characteristic impedance and propagation constant formulation of conventional microstrip lines are analyzed for substrates made of negative materials. It is shown that the formulation can be used for negative material characterization when w/h is larger than 3. For narrow strips, the formulation is valid for low permittivity values. The method is a low cost and wide band characterization technique for negative material characterization.
Keywords
microstrip lines; characteristic impedance; microstrip line structures; negative material characterization; negative materials; propagation constant formulation; Impedance; Microstrip; Permittivity; Power transmission lines; Propagation constant; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
Conference_Location
Toronto, ON
ISSN
1522-3965
Print_ISBN
978-1-4244-4967-5
Type
conf
DOI
10.1109/APS.2010.5561396
Filename
5561396
Link To Document