DocumentCode
1882106
Title
Eleventh IEEE European Test Symposium
fYear
2006
fDate
21-24 May 2006
Abstract
The following topics are dealt with: delay fault testing; single-event upsets; memory testing; reconfigurable systems testing; BIST; test data compression for logic; sigma-delta modulators; current-based testing; power switch testing; test of AD and DA circuits; automatic test pattern generation; advanced analog testing; test of asynchronous and NOC circuitry; and embedded tutorials
Keywords
asynchronous circuits; automatic test pattern generation; built-in self test; fault simulation; logic testing; sigma-delta modulation; AD circuits; DA circuits; NOC circuits; advanced analog testing; asynchronous circuits; automatic test pattern generation; built-in self-testing; current-based testing; delay fault testing; memory testing; power switch testing; reconfigurable systems testing; sigma-delta modulators; single-event upsets; test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location
Southampton
Print_ISBN
0-7695-2566-0
Type
conf
DOI
10.1109/ETS.2006.15
Filename
1628137
Link To Document