Proposal of standard characterization method for dynamic circuit performance

Author

Fujishima, M. ; Asada, K.

Author_Institution

Dept. of Electron. Eng., Tokyo Univ., Japan

fYear

1993

fDate

22-25 Mar 1993

Firstpage

227

Lastpage

232

Abstract

A reliable characterization method is proposed for evaluating effective load capacitance, effective current drivability and effective leak current in dynamic operation. In this method, two test structures are utilized in order to make the evaluation reliable; one is an open-loop inverter array for extracting parameters, and the other is a conventional closed-loop ring oscillator for confirmation. The method is easily extended for general high-speed circuits such as emitter-coupled logic (ECL) and compound-semiconductor circuits. CMOS circuits are used in this study

Keywords

CMOS integrated circuits; emitter-coupled logic; integrated circuit testing; logic arrays; logic gates; logic testing; CMOS circuits; closed-loop ring oscillator; dynamic circuit performance; effective current drivability; effective leak current; effective load capacitance; emitter-coupled logic; open-loop inverter array; standard characterization method; Capacitance; Circuit optimization; Circuit testing; Current measurement; Delay effects; Equations; Inverters; Proposals; Ring oscillators; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1993. ICMTS 1993. Proceedings of the 1993 International Conference on

Conference_Location

Sitges

Print_ISBN

0-7803-0857-3

Type

conf

DOI

10.1109/ICMTS.1993.292915

Filename

292915