• DocumentCode
    1882692
  • Title

    Convolutional Compactors with Variable Polynomials

  • Author

    Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy

  • Author_Institution
    Poznan Univ. of Technol.
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Firstpage
    117
  • Lastpage
    122
  • Abstract
    This paper introduces a new test response compaction scheme that rests on convolutional compactors. The resultant compression, however, is not limited by the ratio of scan chains to compactor outputs. This enhanced convolutional compactor, similarly to its origin, is capable of handling unknown states and detecting multiple errors. The experimental results demonstrate efficiency of the proposed scheme
  • Keywords
    automatic test equipment; boundary scan testing; logic testing; polynomials; convolutional compactors; multiple error detection; scan chains; test response compaction scheme; variable polynomials; Built-in self-test; Compaction; Convolution; Graphics; Logic; Moore´s Law; Polynomials; Registers; Test data compression; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ETS '06. Eleventh IEEE European
  • Conference_Location
    Southampton
  • Print_ISBN
    0-7695-2566-0
  • Type

    conf

  • DOI
    10.1109/ETS.2006.11
  • Filename
    1628163
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1882692