Compensation of Temperature-Drift Errors in Fundamental-Mode Orthogonal Fluxgates

Author

Plotkin, Anton ; Paperno, Eugene ; Samohin, Alexander ; Sasada, Ichiro

Author_Institution

Dept. of Electr. & Comput. Eng., Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva

fYear

2006

fDate

24-27 April 2006

Firstpage

1201

Lastpage

1204

Abstract

A new method for the temperature-compensation of fundamental-mode orthogonal fluxgates that does not require additional hardware has been proposed and implemented. The method is based on the employment of one of the two fluxgate transfer characteristics and the phase of the corresponding output signal. The measurement according to the proposed method can be done during a single, unipolar cycle of the fluxgate excitation. This doubles the measurement update rate compared to conventional methods. The proposed method reduces temperature-drift errors by an order of magnitude. The fluxgate prototype has demonstrated a 20-fold (down to 100 ppm/degC) reduction of the temperature-drift errors

Keywords

compensation; fluxgate magnetometers; fluxgate transfer; fundamental-mode orthogonal fluxgates; temperature compensation; temperature-drift errors; Employment; Hardware; Instrumentation and measurement; Magnetic field measurement; Magnetic noise; Noise measurement; Paper technology; Temperature dependence; Temperature measurement; Temperature sensors; compensation; fundamental-mode; orthogonal fluxgate; temperature-drift errors;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE

Conference_Location

Sorrento

ISSN

1091-5281

Print_ISBN

0-7803-9359-7

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2006.328450

Filename

4124531