DocumentCode
1884036
Title
An improved random walk approach for yield optimization
Author
Yang, Q.S.
fYear
1993
fDate
3-6 May 1993
Firstpage
2145
Lastpage
2147
Keywords
Algorithm design and analysis; Convergence; Laboratories; MMICs; Millimeter wave circuits; Millimeter wave technology; Monte Carlo methods; Optimization methods; Robustness; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location
IEEE
Print_ISBN
0-7803-1281-3
Type
conf
Filename
693107
Link To Document