• DocumentCode
    1884082
  • Title

    Efficient image generation for EO system simulation

  • Author

    Webb, D.L. ; Elliott, D.F. ; Hung, L.L.

  • Author_Institution
    Rockwell Int. Corp., Anaheim, CA, USA
  • Volume
    1
  • fYear
    1994
  • fDate
    31 Oct-2 Nov 1994
  • Firstpage
    540
  • Abstract
    Efficient image generation techniques for electro-optical (EO) system simulation are presented. The techniques reduce computation time by orders of magnitude so Monte Carlo simulations become practical. Ray tracing to project signals onto a focal plane and convolution to blur projected images are time consuming so methods that minimize this time are most important. Methods for efficient simulation of detector characteristics, including noise, are also described
  • Keywords
    Monte Carlo methods; convolution; electro-optical devices; image processing; ray tracing; sensors; simulation; EO system simulation; Monte Carlo simulations; convolution; detector characteristics; electro-optical sensors; electro-optical system simulation; focal plane; image generation; noise; projected images; ray tracing; Background noise; Computational modeling; Convolution; Detectors; Electrooptic devices; Equations; Image generation; Optical noise; Ray tracing; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals, Systems and Computers, 1994. 1994 Conference Record of the Twenty-Eighth Asilomar Conference on
  • Conference_Location
    Pacific Grove, CA
  • ISSN
    1058-6393
  • Print_ISBN
    0-8186-6405-3
  • Type

    conf

  • DOI
    10.1109/ACSSC.1994.471511
  • Filename
    471511