• DocumentCode
    1884136
  • Title

    Electrical properties of doped and non-doped end-capped oligothiophenes in microcontacts

  • Author

    Stoldt, M. ; Bauerle, P. ; Schweizer, H. ; Umbach, E.

  • Author_Institution
    Universitat Wurzburg
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    114
  • Lastpage
    114
  • Abstract
    Summary form only given. The application of oligomers with well defined chain length as active molecular component in electronic and opto-electronic devices (FET´s, LED´s) has recently gained much attraction. The direct investigation of transport phenomena in this oligomer layers should profit by the development of micro- or nanostructured metal/organic/metal heterostructures. We have fabricated microstructures by electron beam lithography and dry etching process with distances in the submicron region between two gold contacts and used vacuum sublimated films of end-capped oligothiophene. Current/voltage measurements using undoped and iodine-doped films have been performed as a function of oligomer chain length n, (n=5..7), electrode distances and doping time. The logarithm of the conductivities depends on the inverse chain length and is strongly dependend on the doping time up to 15 days. The results of the experiments will be analyzed with respect to the different morphology of the films and compared with those on macroscopic films.
  • Keywords
    Doping; Dry etching; Electron beams; FETs; Gold; Lithography; Microstructure; Optoelectronic devices; Performance evaluation; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.834844
  • Filename
    834844