DocumentCode
1885049
Title
Thermal characteristics of two-phase flow of a dielectric fluid in surface-augmented microchannels
Author
Thiagarajan, N. ; Jones, Rory J. ; Pate, Daniel T. ; Bhavnani, Sushil H.
Author_Institution
Dept. of Mech. Eng., Auburn Univ., Auburn, AL
fYear
2008
fDate
28-31 May 2008
Firstpage
189
Lastpage
196
Abstract
Chip-level heat flux levels have risen beyond 250 W/cm2 due to the presence of circuit architecture-driven hot-spots. After intense scrutiny over the past two decades, microchannel heat sinks are closer to commercial implementation as evidenced by the advent of the single-chip silicon cooler announced recently by IBM. Though there are a multitude of studies and data related to multichannel configurations, a number of problems still exist which require further understanding. Contradictory results have been reported in the past about the flow behavior and its characteristics such as critical heal flux (CHF), flow transition and flow instabilities. Two-phase flow instabilities in particular, have been a disturbing feature of flow boiling in microchannels and the area of focus in the recent past. A major portion of the current study is directed towards the analysis and suppression of these instabilities. This paper reports an experimental investigation of flow boiling of dielectric fluid FC72 in a heal sink consisting of 19 microchannels of height 346 mum and width 200 mum (hydraulic diameter = 253 mum). The base of the microchannel is augmented with two 20 mum reentrant cavities to trigger nucleation activity and sustain nucleate boiling. The top cover of the channel is made of Pyrex glass, which allows high speed imaging of the How behavior in the microchannel. The flow was driven by a gear pump and conducted at mass fluxes of 500-2200 kg/m2-s and inlet subcooling up to 20degC. The results delineate the effects of mass flux, heat flux and inlet subcooling on the Onset of Nucleate Boiling (ONB), temperature overshoot and the frequency of flow instabilities calculated using a Fourier transform of the average pressure drop. The frequency of instabilities was found to be a stronger function of mixture quality than of the wall heat flux.
Keywords
Fourier transforms; boiling; dielectric liquids; flow instability; heat sinks; integrated circuits; microchannel flow; semiconductor materials; silicon; two-phase flow; FC72; Fourier transform; IBM; Pyrex glass; chip-level heat flux; circuit architecture-driven hot-spots; critical heal flux; dielectric fluid; flow instabilities; flow transition; microchannel heat sinks; nucleation activity; onset of nucleate boiling; single-chip silicon cooler; surface-augmented microchannels; two-phase flow; Circuits; Dielectrics; Focusing; Frequency; Gears; Glass; Heat sinks; Hydraulic diameter; Microchannel; Silicon; Microchannels; dielectric fluid; phase-change; re-entrant cavities; silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Print_ISBN
978-1-4244-1700-1
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2008.4544270
Filename
4544270
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