Macromodeling of IC output buffers from in-place measurements

Author

Stievano, I.S. ; Maio, I.A. ; Canavero, F.G.

Author_Institution

Dipt. di Elettronica, Politecnico di Torino

fYear

2006

fDate

24-27 April 2006

Firstpage

1726

Lastpage

1730

Abstract

This paper addresses the development of accurate and efficient macromodels of the output ports of digital integrated circuits. The proposed approach is based on the estimation of mathematical parametric relations reproducing the external behavior of devices from transient port voltage and current responses recorded during the normal activity of the IC. The efficiency of the approach is demonstrated on a real device via numerical simulation, also for model estimation based on noisy measurements

Keywords

digital integrated circuits; integrated circuit measurement; integrated circuit modelling; transient response; digital IC ports; digital integrated circuits; integrated circuit macromodeling; noisy measurements; transient port current response; transient port voltage response; Digital integrated circuits; Fixtures; Instrumentation and measurement; Integrated circuit modeling; Logic devices; Mathematical model; Numerical simulation; Parametric statistics; Testing; Voltage; Behavioral models; Digital IC ports; Identification; Macromodels;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE

Conference_Location

Sorrento

ISSN

1091-5281

Print_ISBN

0-7803-9359-7

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2006.328220

Filename

4124645