Design and performance of high-reliability double-layer capacitors

Author

Miller, John R. ; Evans, David A.

fYear

1990

fDate

20-23 May 1990

Firstpage

289

Abstract

The development, testing, and use of a highly reliable double-layer capacitor component designed for operation in the range of -55° to 85°C are described. This component offers a welded tantalum package with an innovative design to provide long life with stable electrical performance. Details of the design are presented along with life- and stress-test data. Unique characteristics are discussed and simple equivalent circuit models are described to assist application engineers in the optimal use of this component. Test results show the following: (1) >2000-h life at 85°C and rated voltage; (2) > 20000 surge current cycles at 85°C; (3) >1000-h life at 85°C under 125% voltage stress conditions; and (4) >700-h operating life at 95°C temperature stress conditions

Keywords

electrolytic capacitors; equivalent circuits; reliability; -55 to 85 C; 2000 h; Capattery; Ta package; backup power source for CMOS memories; characteristics; development; double-layer capacitor component; equivalent circuit models; high-reliability double-layer capacitors; innovative design; life data; long life; maintenance-free; operating life; performance; stable electrical performance; stress-test data; surge current cycles; temperature stress conditions; testing; voltage stress conditions; volumetric efficiency; Capacitors; Circuit testing; Equivalent circuits; Life testing; Packaging; Stress; Surges; Temperature; Voltage; Welding;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 1990. ., 40th

Conference_Location

Las Vegas, NV

Type

conf

DOI

10.1109/ECTC.1990.122204

Filename

122204