DocumentCode
1886430
Title
Signal-to-noise ratio performance comparison of Electron Multiplying CCD and Intensified CCD detectors
Author
Zhang, Wenwen ; Chen, Qian
Author_Institution
Sch. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing
fYear
2009
fDate
11-12 April 2009
Firstpage
337
Lastpage
341
Abstract
Basic principles of current electron multiplying CCD (EMCCD) and intensified CCD (ICCD) detectors are reviewed. Based on their noise characteristics, complete signal-to-noise ratio (SNR) theoretical models are constructed for both devices. At high gain levels, we derive that an ICCD is mainly affected by photocathode noise and micro-channel plate (MCP) noise and the effective readout noise of an EMCCD is less than one electron. Therefore, we propose simplified SNR models of ICCD and EMCCD cameras. SNR performances are compared through simulations and experiments to identify the most influencing parameters. The results show that the SNR performance provided by the ICCD is constricted by photocathode quantum efficiency and noise factor of the MCP. The EMCCD is strongly influenced by thermal dark current noise which will be multiplied up along with the signal by the gain register. Thus, EMCCDs must be strongly cooled in order to get the optimum image quality. Cooled EMCCDs always outperform ICCDs.
Keywords
CCD image sensors; thermal noise; electron multiplying CCD; image quality; intensified CCD detectors; microchannel plate noise; noise factor; photocathode quantum efficiency; signal-to-noise ratio; thermal dark current noise; Cameras; Cathodes; Charge coupled devices; Detectors; Electrons; Image intensifiers; Image storage; Noise level; Phosphors; Signal to noise ratio; Electron Multiplying CCD; Intensified CCD; comparison of SNR performance; low-light-level imaging; noise characteristics;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Analysis and Signal Processing, 2009. IASP 2009. International Conference on
Conference_Location
Taizhou
Print_ISBN
978-1-4244-3987-4
Type
conf
DOI
10.1109/IASP.2009.5054588
Filename
5054588
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