• DocumentCode
    1886430
  • Title

    Signal-to-noise ratio performance comparison of Electron Multiplying CCD and Intensified CCD detectors

  • Author

    Zhang, Wenwen ; Chen, Qian

  • Author_Institution
    Sch. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing
  • fYear
    2009
  • fDate
    11-12 April 2009
  • Firstpage
    337
  • Lastpage
    341
  • Abstract
    Basic principles of current electron multiplying CCD (EMCCD) and intensified CCD (ICCD) detectors are reviewed. Based on their noise characteristics, complete signal-to-noise ratio (SNR) theoretical models are constructed for both devices. At high gain levels, we derive that an ICCD is mainly affected by photocathode noise and micro-channel plate (MCP) noise and the effective readout noise of an EMCCD is less than one electron. Therefore, we propose simplified SNR models of ICCD and EMCCD cameras. SNR performances are compared through simulations and experiments to identify the most influencing parameters. The results show that the SNR performance provided by the ICCD is constricted by photocathode quantum efficiency and noise factor of the MCP. The EMCCD is strongly influenced by thermal dark current noise which will be multiplied up along with the signal by the gain register. Thus, EMCCDs must be strongly cooled in order to get the optimum image quality. Cooled EMCCDs always outperform ICCDs.
  • Keywords
    CCD image sensors; thermal noise; electron multiplying CCD; image quality; intensified CCD detectors; microchannel plate noise; noise factor; photocathode quantum efficiency; signal-to-noise ratio; thermal dark current noise; Cameras; Cathodes; Charge coupled devices; Detectors; Electrons; Image intensifiers; Image storage; Noise level; Phosphors; Signal to noise ratio; Electron Multiplying CCD; Intensified CCD; comparison of SNR performance; low-light-level imaging; noise characteristics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Analysis and Signal Processing, 2009. IASP 2009. International Conference on
  • Conference_Location
    Taizhou
  • Print_ISBN
    978-1-4244-3987-4
  • Type

    conf

  • DOI
    10.1109/IASP.2009.5054588
  • Filename
    5054588