DocumentCode
1890444
Title
Table of contents
fYear
2013
fDate
16-19 Sept. 2013
Abstract
The following topics are dealt with: ATE system design; FPGA test application; ATS management; RF testing; test software technique; design for testability; ATE standard; and TPS development.
Keywords
automatic test equipment; automatic test software; design for testability; field programmable gate arrays; ATE standard; ATE system design; ATS management; FPGA test application; RF testing; TPS development; design for testability; test software technique;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2013 IEEE
Conference_Location
Schaumburg, IL
ISSN
1088-7725
Print_ISBN
978-1-4673-5681-7
Type
conf
DOI
10.1109/AUTEST.2013.6645032
Filename
6645032
Link To Document