• DocumentCode
    1891538
  • Title

    TPS solutions for aircraft controller system LRIs in conjunction with LM-STAR®

  • Author

    O´Donnell, Steven J. ; Anzile, Paolo

  • Author_Institution
    Lockheed Martin, Orlando, FL, USA
  • fYear
    2013
  • fDate
    16-19 Sept. 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The new tester selected by the Italian Air Force to be the standard platform for depot level testing on several Line Replaceable Units (LRU) of European Fighter (EF2000) Tranche 2 configuration is the LM-STAR®. This solution, applicable for the second level of maintenance, is the result of joint cooperation between Lockheed Martin and Selex-ES, a Finmeccanica Company. To date, the acceptance and the delivery of seven LM-STAR stations (Galileo Euro Test Set variant) has occurred; two more are in progress. Currently, more than 25 Test Program Sets (TPS) have been designed, developed, integrated, and fielded using LM-STAR. For more complex LRU, which are part of Armament Controller or Visual and Display System, a new hardware solution has been designed and purchased, also based both on development and in-service experience of previous Tranche 1 TPS with another ATE. Redesigned holding fixtures with new internal circuit cards in addition to LM-STAR capabilities improved the TPS performances with results (self-check, execution time, automatic tests, software loading) better than the ones on dedicated platforms for LRU manufacturing. In this paper a brief overview will be provided about these choices and the benefits on TPS hardware composition and test management. The LM-STAR TPS development environment, which supports both C and ATLAS TPS, will also be analyzed. The underlying system software architecture that protects the TPS from costly hardware obsolescence will also be described. An overview of the support of a complex international program will be explored. We will describe both hardware and software technological obstacles that had to be overcome to achieve mission success while maintaining cost and schedule requirements.
  • Keywords
    automatic testing; military aircraft; military avionics; ATE; European Fighter Tranche 2; Galileo Euro test set variant; LM-STAR; LRIs; TPS solution; aircraft controller system; armament controller; automatic testing; depot level testing; hardware obsolescence; line replaceable units; test program sets; visual and display system; Calibration; Connectors; Fixtures; Hardware; Loss measurement; Software; Voltage measurement; 1553; 3910; CMA; EFA; LM-STAR; PBL;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2013 IEEE
  • Conference_Location
    Schaumburg, IL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4673-5681-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2013.6645073
  • Filename
    6645073