DocumentCode
1891538
Title
TPS solutions for aircraft controller system LRIs in conjunction with LM-STAR®
Author
O´Donnell, Steven J. ; Anzile, Paolo
Author_Institution
Lockheed Martin, Orlando, FL, USA
fYear
2013
fDate
16-19 Sept. 2013
Firstpage
1
Lastpage
7
Abstract
The new tester selected by the Italian Air Force to be the standard platform for depot level testing on several Line Replaceable Units (LRU) of European Fighter (EF2000) Tranche 2 configuration is the LM-STAR®. This solution, applicable for the second level of maintenance, is the result of joint cooperation between Lockheed Martin and Selex-ES, a Finmeccanica Company. To date, the acceptance and the delivery of seven LM-STAR stations (Galileo Euro Test Set variant) has occurred; two more are in progress. Currently, more than 25 Test Program Sets (TPS) have been designed, developed, integrated, and fielded using LM-STAR. For more complex LRU, which are part of Armament Controller or Visual and Display System, a new hardware solution has been designed and purchased, also based both on development and in-service experience of previous Tranche 1 TPS with another ATE. Redesigned holding fixtures with new internal circuit cards in addition to LM-STAR capabilities improved the TPS performances with results (self-check, execution time, automatic tests, software loading) better than the ones on dedicated platforms for LRU manufacturing. In this paper a brief overview will be provided about these choices and the benefits on TPS hardware composition and test management. The LM-STAR TPS development environment, which supports both C and ATLAS TPS, will also be analyzed. The underlying system software architecture that protects the TPS from costly hardware obsolescence will also be described. An overview of the support of a complex international program will be explored. We will describe both hardware and software technological obstacles that had to be overcome to achieve mission success while maintaining cost and schedule requirements.
Keywords
automatic testing; military aircraft; military avionics; ATE; European Fighter Tranche 2; Galileo Euro test set variant; LM-STAR; LRIs; TPS solution; aircraft controller system; armament controller; automatic testing; depot level testing; hardware obsolescence; line replaceable units; test program sets; visual and display system; Calibration; Connectors; Fixtures; Hardware; Loss measurement; Software; Voltage measurement; 1553; 3910; CMA; EFA; LM-STAR; PBL;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2013 IEEE
Conference_Location
Schaumburg, IL
ISSN
1088-7725
Print_ISBN
978-1-4673-5681-7
Type
conf
DOI
10.1109/AUTEST.2013.6645073
Filename
6645073
Link To Document