DocumentCode
1891556
Title
Research on technology of ATS test program auto generating driven by test requirement
Author
Meng Chen ; Wang Cheng ; Yang Sen
Author_Institution
Mech. Eng. Coll., Shijiazhuang, China
fYear
2013
fDate
16-19 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
To solve the transplantable problem of test program set (TPS) in the automatic test system (ATS), a new automatic generation technology based on demand-driven ATS program is put forward. Firstly, it utilizes the test requirement set to replace the test program set, and the work of generating test program from test requirements is completed by test environment. In addition, the test requirements will automatically generate executable test programs on different platforms so as to achieve the unambiguous transplantation of test requirements among different platforms. Then, mapping mechanisms between different models can be studied by establishing test requirement model as the platform independent model (PIM) and test program as the platform special model (PSM). Besides, the “template+compile” method is adopted to realize the automatic generation of test program. Specifically, the test requirements are translated into the different test flow description languages (TFDL) of different platforms through XSLT template, and then a compiler shall be developed to translate TFSL into the intermediate programs of C language. Finally, executable programs or dynamic link library (DLL) will be automatically generated by the means of commercial compilers.
Keywords
automatic test equipment; automatic test pattern generation; ATS test program; C language; XSLT template; automatic generation technology; automatic test system; dynamic link library; mapping mechanisms; platform independent model; platform special model; template+compile method; test flow description languages; test program set; test requirement; IEEE standards; Libraries; Program processors; User interfaces; Visualization; XML; automatic generation of test program; automatic test system; test program set; test requirement set;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2013 IEEE
Conference_Location
Schaumburg, IL
ISSN
1088-7725
Print_ISBN
978-1-4673-5681-7
Type
conf
DOI
10.1109/AUTEST.2013.6645074
Filename
6645074
Link To Document