• DocumentCode
    1893525
  • Title

    Manufacturability-aware physical layout optimizations

  • Author

    Pan, David Z. ; Wong, Martin D F

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • fYear
    2005
  • fDate
    9-11 May 2005
  • Firstpage
    149
  • Lastpage
    153
  • Abstract
    Nanometer VLSI design is greatly challenged by the growing interdependency between manufacturing and design. Existing approaches in design for manufacturability (DFM) are still mostly post design, rather than during design. To really bridge the gap between design and manufacturing, it is important to model and feed proper manufacturing metrics and cost function upstream, especially at the key physical layout optimization stages such as routing and placement to have major impacts. In this paper, the authors show several aspects of the true manufacturability-aware physical design from lithography-aware routing to redundant-via aware routing to CMP aware floor planning and placement, and show their promises.
  • Keywords
    VLSI; circuit optimisation; design for manufacture; lithography; VLSI design; design for manufacturability; lithography-aware routing; manufacturability-aware physical layout optimizations; placement; redundant-via aware routing; Bridges; Cost function; Design for manufacture; Design optimization; Feeds; Pulp manufacturing; Routing; Very large scale integration; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
  • Print_ISBN
    0-7803-9081-4
  • Type

    conf

  • DOI
    10.1109/ICICDT.2005.1502616
  • Filename
    1502616