• DocumentCode
    1894858
  • Title

    Comparison of high voltage rectifier structures

  • Author

    Mehrotra, Manoj ; Baliga, B.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1993
  • fDate
    18-20 May 1993
  • Firstpage
    199
  • Lastpage
    204
  • Abstract
    A comparative analysis of the p-i-n, SSD (static shielding diode), SFD (soft and fast recovery diode), SPEED (self-adapting P-emitter efficiency diode), and MPS (merged P-N Schottky) rectifiers is performed using the two-dimensional numerical simulator MEDICI. Identical drift region properties are used to obtain the forward I-V, reverse I-V, and reverse recovery characteristics. The MPS, SSD, and SFD rectifiers are found to exhibit a much smaller stored charge and a shorter reverse recovery time than the other rectifiers. As the dose and depth of the shallow P-region implant is increased, the SSD rectifier characteristics are found to shift from those of the MOS rectifier to those of the p-i-n rectifier. It is concluded that the tradeoff between stored charge, leakage current, reverse recovery time, and forward voltage drop is best for the MPS and SSD rectifiers. These rectifiers also exhibit improved soft recovery during switching
  • Keywords
    Schottky-barrier diodes; p-i-n diodes; solid-state rectifiers; MEDICI; drift region properties; fast recovery diode; forward I-V characteristics; forward voltage drop; high voltage rectifier structures; leakage current; merged P-N Schottky; reverse I-V characteristics; reverse recovery characteristics; self-adapting P-emitter efficiency diode; shallow P-region implant; soft recovery; static shielding diode; stored charge; two-dimensional numerical simulator; Analytical models; Implants; Medical simulation; Numerical simulation; P-i-n diodes; PIN photodiodes; Performance analysis; Rectifiers; Schottky diodes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1993. ISPSD '93., Proceedings of the 5th International Symposium on
  • Conference_Location
    Monterey, CA
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-1313-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.1993.297080
  • Filename
    297080