Statistical behavioral modeling of integrated circuits

Author

Swidzinski, J.F. ; Styblinski, M.A. ; Xu, G.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

Volume

6

fYear

1998

fDate

31 May-3 Jun 1998

Firstpage

98

Abstract

A full statistical model for the behavioral parameter of an analog cell is presented. Behavioral parameter variations with respect to manufacturing process disturbances are approximated utilizing multivariate modeling techniques which allow the means, standard deviations, parameter correlations and the actual distributions to be reproduced with reasonable accuracy. The modeling procedure is demonstrated in the statistical behavioral modeling of a MOSFET-C notch filter at the cell level and a phase-locked loop (PLL) tunable filter at the system level. The accuracy of the results obtained utilizing the characterized behavioral MOSFET-C filter and the PLL models, relative to the circuit-level simulation is considered

Keywords

analogue integrated circuits; integrated circuit modelling; statistical analysis; MOSFET-C notch filter; PLL tunable filter; analog cell; behavioral parameter variations; full statistical model; integrated circuits; manufacturing process disturbances; modeling procedure; multivariate modeling techniques; phase-locked loop; statistical behavioral modeling; Circuit simulation; Filters; Fluctuations; Integrated circuit modeling; MOSFET circuits; Manufacturing processes; Phase locked loops; Statistical analysis; Tunable circuits and devices; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-4455-3

Type

conf

DOI

10.1109/ISCAS.1998.705221

Filename

705221