SEALER: Novel Monte-Carlo Simulator for Single Event Effects of Composite-Materials Semiconductor Devices

Author

Ibe, E. ; Yahagi, Y. ; Yamaguehi, H. ; Kameyama, H.

Author_Institution

Hitachi Ltd., Yokohama

fYear

2005

fDate

19-23 Sept. 2005

Abstract

A Monte-Carlo simulation code SEALER was developed for neutron-induced single event upset of semiconductor devices at the ground level, in which composite material effects are fully simulated. Any size and structures of 8 composite material such as Si, SiO₂, Si₃N₄, Ta₂O₅, WSi₂, Cu, Al, TiN can be included for analyses of nuclear spallation reactions and charge collection mechanisms. Some preliminary implications of composite material effects are demonstrated including an apparent contribution of elastic scattering to single event upset in lower energy region as low as 2 MeV or even lower.

Keywords

Monte Carlo methods; aluminium; composite materials; copper; neutron effects; nuclear spallation; semiconductor devices; semiconductor process modelling; silicon; silicon compounds; tantalum compounds; titanium compounds; tungsten compounds; Al; Cu; Monte-Carlo simulation code SEALER; Si; Si₃N₄; SiO₂; Ta₂O₅; TiN; WSi₂; charge collection mechanisms; composite material effects; elastic scattering; neutron-induced single event upset; nuclear spallation reactions; semiconductor devices; Analytical models; Atmospheric modeling; Composite materials; Discrete event simulation; Identity-based encryption; Neutrons; Scattering; Semiconductor devices; Semiconductor materials; Single event upset; Cu; Monte Carlo simulation; SiO2; WSi2; composite material; elastic scattering; non-elastic scattering; nuclear spallation reaction; single event upset;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on

Conference_Location

Cap d´Agde

ISSN

0379-6566

Print_ISBN

978-0-7803-9501-5

Type

conf

DOI

10.1109/RADECS.2005.4365590

Filename

4365590