• DocumentCode
    1896013
  • Title

    Thin film monitoring with silicon bulk acoustic resonators

  • Author

    Lee, Joshua E -Y ; Bahreyni, Behraad ; Seshia, Ashwin A.

  • Author_Institution
    Dept. of Eng., Univ. of Cambridge, Cambridge
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    581
  • Lastpage
    584
  • Abstract
    This paper reports a single-crystal silicon mass sensor based on a square-plate resonant structure excited in the wine glass bulk acoustic mode at a resonant frequency of 2.065 MHz and an impressive quality factor of 4 million at 12 mtorr pressure. Mass loading on the resonator results in a linear downshift in the resonant frequency of this device, wherein the measured sensitivity is found to be 175 Hz cm2/mug. The silicon resonator is embedded in an oscillator feedback loop, which has a short-term frequency stability of 3 mHz (approximately 1.5 ppb) at an operating pressure of 3.2 mtorr, corresponding to an equivalent mass noise floor of 17 pg/cm2. Possible applications of this device include thin film monitoring and gas sensing, with the potential added benefits of scalability and integration with CMOS technology.
  • Keywords
    CMOS integrated circuits; bulk acoustic wave devices; gas sensors; oscillators; silicon; thin film sensors; gas sensing; oscillator feedback loop; silicon bulk acoustic resonators; silicon resonator; single-crystal silicon mass sensor; square-plate resonant structure; thin film monitoring; wine glass bulk acoustic mode; Acoustic devices; Acoustic sensors; CMOS technology; Glass; Monitoring; Q factor; Resonance; Resonant frequency; Semiconductor thin films; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2008 IEEE
  • Conference_Location
    Lecce
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-2580-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2008.4716506
  • Filename
    4716506