• DocumentCode
    1896025
  • Title

    Predicting the mechanical behavior of self-deformed micromachined cantilevers

  • Author

    Pasupuleti, A. ; Sahin, F. ; Raisanen, A. ; Hebding, J.L. ; Walter, W.W. ; Hirschman, K.D.

  • Author_Institution
    Rochester Inst. of Technol., NY, USA
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    254
  • Lastpage
    258
  • Abstract
    This research aims at characterizing and predicting the mechanical behavior of thin film materials that are used in micro electro mechanical systems (MEMS). Micro machined bilayer cantilevers of various dimensions were fabricated and analyzed to extract models. The models designed in this process are foreseen to be an essential tool for MEMS designers as they would relate the loading parameters, material properties and geometry of the microstructures with its performance characteristics. A computational methodology based on empirical modeling was developed that enables the designer to prototype the designs before fabrication. The proposed model generates accurate material properties applicable at the microscopic level, thereby accelerating the design and development process. The performance of the proposed model was compared to the experimental values and the results were found to be very encouraging.
  • Keywords
    deformation; micromachining; micromechanical devices; prototypes; thin films; MEMS; computational methodology; design prototype; empirical modeling; loading parameter; material properties; mechanical behavior prediction; micro electro mechanical systems; microstructure geometry; self-deformed micromachined cantilever; thin film materials; Fabrication; Geometry; Material properties; Mechanical systems; Micromechanical devices; Microstructure; Process design; Prototypes; Solid modeling; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502810
  • Filename
    1502810