• DocumentCode
    1896595
  • Title

    Thermal analysis of power MOSFETs using Rebeca-3D thermal modeling software (from Epsilon Ingenierie) versus physical measurements and possible extractions

  • Author

    Pandya, Kaushal

  • Author_Institution
    Vishay Siliconix, Santa Clara, CA, USA
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    394
  • Lastpage
    397
  • Abstract
    Shrinking semiconductor packages, increasing die densities, process changes, and the requirements for optimizing electro-mechanical assemblies are making sound thermal designs more important than ever. Depending on the application scenario, thermal considerations can be approached from two angles. Rebeca-3D, a semi-FEA based software tool, provides the ability to develop a thermal model using detailed device geometry and material characteristics. The tool´s versatility allows it to be used to analyze a design in a range of application scenarios. Using this platform, this paper discusses actual examples of thermal model development and results. The results are first validated by comparing with datasheet information and experiments in an application lab. Following simulation, the platform is used to extrapolate the measurements done in the application lab. The results enable development of thermal performance profiles for different packages and for different electrical and assembly conditions. Several examples are discussed with figures and pictures. The study compares the results of simulations and tests on actual devices.
  • Keywords
    electronic engineering computing; finite element analysis; power MOSFET; semiconductor device measurement; semiconductor device models; semiconductor device packaging; software tools; thermal analysis; Rebeca-3D thermal modeling; electronic engineering computing; finite element analysis; power MOSFET; semi-FEA based software tool; semiconductor device measurement; semiconductor device models; semiconductor device packaging; semiconductor packages; thermal analysis; thermal model development; thermal performance profile; Application software; Assembly; Design optimization; Geometry; MOSFETs; Power measurement; Semiconductor device packaging; Software measurement; Software tools; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502836
  • Filename
    1502836