DocumentCode
1896649
Title
Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory
Author
Layton, Phil ; Longden, Larry ; Patnaude, Ed
Author_Institution
Maxwell Technol. Inc., San Diego
fYear
2005
fDate
19-23 Sept. 2005
Abstract
Space systems require high reliability nonvolatile memory. This paper analyzes the reliability of an EEPROM for data retention, endurance and radiation performance across multiple die lots.
Keywords
EPROM; radiation effects; reliability; EEPROM; data retention; endurance; multiple die lots; nonvolatile memory; radiation performance; reliability; Conducting materials; EPROM; Insulation; Logic; Nonvolatile memory; Performance analysis; Production; Silicon compounds; Space technology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location
Cap d´Agde
ISSN
0379-6566
Print_ISBN
978-0-7803-9502-2
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2005.4365649
Filename
4365649
Link To Document