• DocumentCode
    1897000
  • Title

    Modelling methodology for linear elastic compound modelling versus visco-elastic compound modelling

  • Author

    van Silfhout, R.B.R. ; Beijer, J.G.J. ; Zhang, Kouchi ; van Driel, W.D.

  • Author_Institution
    Philips Appl. Technol., Eindhoven, Netherlands
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    483
  • Lastpage
    489
  • Abstract
    Finite element (FE) simulations take an important place in predicting the thermo-mechanical plastic-package behaviour. Several studies in both industry and research cover this topic since the mechanical impact of the epoxy moulding compound (EMC) behaviour is of major impact on package reliability and the understanding of the material behaviour is limited. In the history of package modelling, large differences in thermo-mechanical stresses are found between (temperature dependent) elastic calculations and time dependent calculations, such as visco-elastic calculations. Visco-elastic compound behaviour is often recommended to take into account to predict stresses reliably, but takes significant effort and time for material characterization. In this paper the origin of stress differences was analyzed for different EMC material models in different realistic process conditions. By understanding the impact of realistic compound behaviour during real process conditions, an effective modelling approach was proposed which took less material characterisation and less calculation time. The modelling method was applied on a package simulation analyzing 3 different compounds and is verified by visco-elastic simulations.
  • Keywords
    electronics packaging; finite element analysis; polymers; reliability; semiconductor process modelling; viscoelasticity; epoxy moulding compound; finite element simulations; linear elastic compound modelling; material characterization; package reliability; thermomechanical plastic package behaviour; viscoelastic compound modelling; Analytical models; Electromagnetic compatibility; Finite element methods; History; Materials reliability; Packaging; Predictive models; Temperature dependence; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502853
  • Filename
    1502853