• DocumentCode
    1897141
  • Title

    Advanced electronic counter-measures laboratory design

  • Author

    Hartmann, W.P.

  • Author_Institution
    Tech. Services Oper., AIL Syst. Inc., Lancaster, CA, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    252
  • Lastpage
    258
  • Abstract
    The Department of Defense has decreed that all new or upgraded laboratory facilities must use an architecture that is highly flexible. New Designs must have sufficient flexibility to satisfy future needs, make maximum use of commercial off-the-shelf products, include products with built-in vendor support, and adhere to DoD and industry standards. Under contract to the US Air Force, AIL Systems Inc./Technical Services Operations developed an advanced electronic warfare system consisting of real-time and non real-time networks. The laboratory encompasses digital, radio frequency, and platform simulation and measurements. This paper describes the architecture used in the laboratory to tie together the disparate elements of digital, radio frequency, and avionics simulators in a manner that is both cost effective and flexible. The program yielded an electronic warfare assessment system suitable for either man-in-the-loop or automatic testing
  • Keywords
    aerospace simulation; aerospace testing; automatic testing; electronic countermeasures; laboratories; military standards; military systems; real-time systems; DoD standards; US Air Force; advanced electronic warfare system; automatic testing; avionics simulators; built-in vendor support; commercial off-the-shelf products; electronic counter-measures laboratory; electronic warfare assessment system; laboratory design; nonreal-time networks; platform simulation; real-time networks; Aerospace electronics; Automatic testing; Contracts; Costs; Defense industry; Electronic warfare; Frequency measurement; Laboratories; Radio frequency; Real time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633622
  • Filename
    633622