The electron beam orbit sensitivity of the photon flux of the photon beam line

Author

Hsu, Ian ; Luo, G.H. ; Tsang, K.L. ; Chu, C.-C. ; Yu, C.-I. ; Weng, W.T. ; Chung, S.C.

Author_Institution

Inst. of Nucl. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan

Volume

5

fYear

1995

fDate

1-5 May 1995

Firstpage

3364

Abstract

The effects of the electron beam position as well as the electron beam orbit slope at the source point on the photon flux of the photon beam lines were studied both by ray tracing simulation and by experiments. The experimental result shown that 10 μm beam position change will cause more than 1% of the photon flux change which agreed with the simulation results. However, for some distorted orbit slope (0.2 mrad), 10 μm beam position change can cause 8% of the photon flux change

Keywords

X-ray apparatus; X-ray production; beam handling techniques; electron accelerators; electron beams; particle beam dynamics; ray tracing; storage rings; beam position change; distorted orbit slope; electron beam orbit sensitivity; electron beam orbit slope; electron beam position; photon beam line; photon flux; ray tracing simulation; source point; Electron beams; Extraterrestrial measurements; Fluctuations; Light sources; Nuclear and plasma sciences; Optical distortion; Position measurement; Ray tracing; Size measurement; Synchrotron radiation;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1995., Proceedings of the 1995

Conference_Location

Dallas, TX

Print_ISBN

0-7803-2934-1

Type

conf

DOI

10.1109/PAC.1995.505883

Filename

505883