The electro-thermal Smoothie database model for LDMOS devices

Author

Cuoco, V. ; Neo, W.C.E. ; Spirito, M. ; Yanson, O. ; Nenadovic, N. ; de Vreede, L.C.N. ; Jos, H.F.F. ; Burghartz, J.N.

Author_Institution

Delft Univ. of Technol., Netherlands

fYear

2004

fDate

21-23 Sept. 2004

Firstpage

457

Lastpage

460

Abstract

In this paper, we present the electro-thermal (ET) extension of the Smoothie database model for LDMOS devices together with its experimental verification. For the DC verification, the drain current was measured both in continuous mode and under isothermal conditions at different temperatures. In the RF large-signal verification, we used realistic loading conditions for the LDMOS devices while providing two-tone as well as IS-95 CDMA test conditions. With the aid of the above, thermal memory effects were studied by monitoring the device linearity versus tone spacing. In all the experiments, Smoothie demonstrated an excellent agreement with the measured results.

Keywords

power MOSFET; semiconductor device measurement; semiconductor device models; thermal resistance; DC verification; IS-95 CDMA test conditions; LDMOS devices; RF large-signal verification; RF power devices; continuous mode drain current; device linearity/tone spacing; electro-thermal Smoothie database model; isothermal conditions drain current; model electro-thermal extension; thermal impedance; thermal memory effects; two-tone tests; Circuit simulation; Current measurement; Databases; Isothermal processes; MOSFETs; Predictive models; Radio frequency; Temperature dependence; Temperature distribution; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European

Print_ISBN

0-7803-8478-4

Type

conf

DOI

10.1109/ESSDER.2004.1356590

Filename

1356590