• DocumentCode
    1904760
  • Title

    Ferroelectrics for non-volatile memories

  • Author

    Cuppens, R. ; Larsen, P.K. ; Spierings, G.A.C.M.

  • Author_Institution
    Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands
  • fYear
    1992
  • fDate
    14-17 Sept. 1992
  • Firstpage
    245
  • Lastpage
    252
  • Abstract
    In the late 1980s the interest in ferroelectric materials for memory applications has been renewed on the basis of concepts where ferroelectric thin film capacitors are embedded in Integrated Circuit processes. This paper discusses the application of ferroelectric thin films in memories. First ferroelectric thin film capacitors are reviewed followed by a discussion on the deposition techniques for ferroelectric thin films and on the integration with an IC technology. Next measured data of some important electrical characteristics for non-volatile memories are treated. Finally different ferroelectric memory cell configurations and their consequences on memory characteristics are discussed.
  • Keywords
    Application specific integrated circuits; Capacitors; Electric variables; Electric variables measurement; Ferroelectric materials; Integrated circuit measurements; Integrated circuit technology; Nonvolatile memory; Sputtering; Thin film circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    0444894780
  • Type

    conf

  • Filename
    5435177