• DocumentCode
    1905468
  • Title

    Efficient identification of major contributions to EMI-induced rectification effects in analog automotive circuits

  • Author

    Loeckx, Johan ; Gielen, Georges

  • Author_Institution
    ESAT/MICAS, KU Leuven Univ.
  • fYear
    2006
  • fDate
    Feb. 27 2006-March 3 2006
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    Rectification is a major cause of failure in EMC susceptibility measurements of analog automotive circuits. Especially charge pumping, the change of a DC operating point due to interference, is a harmful effect. In this paper, a methodology is proposed that gives an estimate of the DC voltage shifts caused by conducted interference with relation to frequency, as well as the contributions of each device. This way, the designer can identify the effects and underlying causes of rectification easily and quickly. The approach is much faster than traditional transient analysis, and time complexity is independent of the frequency of the electromagnetic interference
  • Keywords
    analogue circuits; automotive components; electromagnetic compatibility; electromagnetic interference; rectification; DC voltage shifts; EMC susceptibility; EMI-induced rectification; analog automotive circuits; conducted interference; electromagnetic interference; time complexity; traditional transient analysis; Automotive engineering; Charge pumps; Circuits; Costs; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiative interference; Frequency estimation; Immunity testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    3-9522990-3-0
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2006.214891
  • Filename
    1629581