Limitations of Digital CMOS-Processes for Analog Applications due to Channel Length Modulation and Hot Carrier Degradation

Author

Steimle, M. ; Muhlhoff, H.-M.

Author_Institution

Siemens AG, Semiconductor Division, Munich, Germany

fYear

1991

fDate

16-19 Sept. 1991

Firstpage

429

Lastpage

432

Keywords

Analog circuits; Degradation; Digital circuits; Digital modulation; Hot carriers; MOS devices; MOSFETs; Mirrors; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Device Research Conference, 1991. ESSDERC '91. 21st European

Conference_Location

Montreux, Switzerland

Print_ISBN

0444890661

Type

Filename

5435298

Link To Document