Simulation and measurement of the transient field of indirect electrostatic discharge

Author

Yuan, Zhiyong ; Li, Tun ; He, Jinliang ; Chen, Shuiming ; Chen, Weiyuan ; Zeng, Rong

Author_Institution

Dept. of Electr. Eng., Tsinghua Univ., Beijing

fYear

2006

fDate

Feb. 27 2006-March 3 2006

Firstpage

634

Lastpage

637

Abstract

The transient near-field of the electrostatic discharge (ESD) is a kind of high power transient phenomenon, which strongly affects the operation of the electronic devices. In this paper, the transient field of the indirect electrostatic discharge through the vertical coupling plane (VCP) is numerically simulated by using the FDTD method with the PML. The configuration of the current source is considered carefully. The simulation results on different positions show different transient effects. The simulated data are compared with those measured by an optic testing system

Keywords

electric fields; electrostatic discharge; finite difference time-domain analysis; ESD; FDTD method; current source; high power transient phenomenon; indirect electrostatic discharge; transient field; vertical coupling plane; Current density; Electromagnetic transients; Electronic equipment testing; Electrostatic discharge; Electrostatic measurements; Fault location; Finite difference methods; Numerical simulation; System testing; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on

Conference_Location

Singapore

Print_ISBN

3-9522990-3-0

Type

conf

DOI

10.1109/EMCZUR.2006.215014

Filename

1629704