DocumentCode
1908778
Title
Impact of non-equilibrium transport and series resistances in 0.1um bulk and SOI MOSFETs
Author
Bricout, Paul Henri ; Augendre, Emmanuel ; Dubois, Emmanuel
Author_Institution
Inst. Superieur d´´Electronique Nord, France
fYear
1997
fDate
22-24 September 1997
Firstpage
204
Lastpage
207
Keywords
Computational modeling; Degradation; MOSFETs; Monte Carlo methods; Optical films; Predictive models; Scattering; Thin film devices; Thin film transistors; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN
2-86332-221-4
Type
conf
DOI
10.1109/ESSDERC.1997.194401
Filename
1503331
Link To Document