Using a Precision Bridge for Magnitude and Phase Measurement of a Multiplying DAC with an AC Reference

Author

Maezawa, Akira ; Gong, Bo ; Waltrip, Bryan ; Fitzpatrick, Gerald ; Wang, Yicheng

Author_Institution

Quantum Electr. Metrol. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD

fYear

2008

fDate

12-15 May 2008

Firstpage

777

Lastpage

780

Abstract

The Andeen-Hagerling AH2700A Ultra-Precision 50 Hz-20 kHz Capacitance Bridge is used to determine the magnitude and phase errors of Texas Instrument´s DAC8811 16-bit Multiplying DAC. An automated testing method using a USB-SPI interface and LabView^TM to control the DAC is presented. The DAC output magnitude and phase errors are dependent on input code, input frequency, and the input voltage magnitude, and a hypothesis for the dependencies is discussed.

Keywords

automatic testing; bridge circuits; digital-analogue conversion; phase measurement; AC reference; LabView^TM; USB-SPI interface; automated testing method; capacitance bridge; digital-analogue conversion; magnitude measurement; multiplying DAC; phase measurement; precision bridge; Bridge circuits; Capacitance; Frequency; Instrumentation and measurement; Instruments; Logic circuits; Metrology; Operational amplifiers; Phase measurement; Voltage; Capacitance; capacitance bridge; linearity; multiplying DAC; phase;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE

Conference_Location

Victoria, BC

ISSN

1091-5281

Print_ISBN

978-1-4244-1540-3

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2008.4547142

Filename

4547142