DocumentCode
1910573
Title
Miniaturization of thin cantilever-like contacts
Author
Fluss, Harold S.
Author_Institution
AT&T Bell Lab., Whippany, NJ, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
996
Abstract
One consequence of connector miniaturization is the increased sensitivity of the contact normal force to tolerances in geometric and material parameters. This effect is studied for contacts that can be modeled structurally as thin cantilevers, where the tip load corresponds to the normal force. Design curves are developed showing the change in sensitivity as a function of reduction in size for tolerances in length, width, thickness, and Young´s modulus. The complementary problem of determining the reduction in tolerance needed to maintain a given normal force variation as the contact is reduced is also solved. The contact that is stressed into the elastic-plastic regime in the reduced configuration is considered. It is found that, for thin cantilever-like contacts, the sensitivity of normal forces is increased most for tolerances in length, followed by tolerances in thickness. However, since the percentage tolerance in thickness is greater than the tolerance in length for most designs, thickness will likely be the critical parameter in reducing a design. It is also found that to maintain a given normal force range as one scales down, the tolerances allowed have to be reduced by the scaling factor
Keywords
electric connectors; electrical contacts; sensitivity analysis; Young´s modulus; connector miniaturization; constant tolerance; contact normal force; elastic-plastic regime; geometric parameters; material parameters; normal force variation; sensitivity; thin cantilever-like contacts; Closed-form solution; Connectors; Contacts; Dielectrics and electrical insulation; Equations; Inorganic materials; Manufacturing processes; Materials reliability; Process design; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122309
Filename
122309
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