• DocumentCode
    1910755
  • Title

    Possibilities of electron beam nano-meter-scale fabrication of Si(111) using alkyl monolayers

  • Author

    Yamada, Taro ; Takano, Nao ; Yamada, Keiko ; Yoshitomi, Shuhei ; Inoue, Tomoyuki ; Osaka, Tetsuya

  • Author_Institution
    Kagani Memorial Lab. for Mater. Sci. & Technol., Waseda Univ., Tokyo, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    403
  • Lastpage
    408
  • Abstract
    A novel process of electron-beam nanometer-scale fabrication on Si(111) wafer surfaces has been proposed on the basis of application of organic monolayers as the ultimately thin patterning media. The monolayers on Si(111) wafer surfaces composed of alkyl groups (Cn H2n+1_) prepared with the Grignard reagents were subjected to electron-beam patterning, and deposition of metals onto the electron-bombarded patterns by immersion into aqueous solutions containing Ni2+ or Cu2+ ions. This entire process has been put into practice successfully as a benchmark test. The strength of alkyl-covered Si(111) surface against the processing environment such as in vacuum and aqueous solutions has been demonstrated
  • Keywords
    electron beam lithography; elemental semiconductors; monolayers; nanotechnology; organic compounds; silicon; Grignard reagent; Si; Si(111) wafer surface; alkyl group; aqueous solution; electron beam nanometer-scale fabrication; metal deposition; organic monolayer; Atomic beams; Atomic layer deposition; Benchmark testing; Electron beams; Fabrication; Laboratories; Materials science and technology; Nanostructures; Probes; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2001. IEEE-NANO 2001. Proceedings of the 2001 1st IEEE Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-7215-8
  • Type

    conf

  • DOI
    10.1109/NANO.2001.966456
  • Filename
    966456