• DocumentCode
    1911066
  • Title

    Sequential analysis of resonant tunneling diodes

  • Author

    Genoe, J. ; Van Hoof, C. ; Borghs, G.

  • Author_Institution
    IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
  • fYear
    1992
  • fDate
    14-17 Sept. 1992
  • Firstpage
    883
  • Lastpage
    886
  • Abstract
    In recent years, it has been established that a substantial part of the current through a double barrier resonant tunneling structure is transported by sequential tunneling instead of fully coherent tunneling. The theoretical framework of sequential tunneling is especially attractive since the admittance of the device can be obtained immediately. In order to complete this model we have investigated the frequency behavior of the charging and discharging phenomena in the quantum well. All geometric capacitances and the quantum capacitance [1] have been taken into account in this model.[2]
  • Keywords
    Admittance; Diodes; Energy states; Frequency; Microelectronics; Quantum capacitance; Resonant tunneling devices; Sequential analysis; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    0444894780
  • Type

    conf

  • Filename
    5435427