DocumentCode
1911066
Title
Sequential analysis of resonant tunneling diodes
Author
Genoe, J. ; Van Hoof, C. ; Borghs, G.
Author_Institution
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
fYear
1992
fDate
14-17 Sept. 1992
Firstpage
883
Lastpage
886
Abstract
In recent years, it has been established that a substantial part of the current through a double barrier resonant tunneling structure is transported by sequential tunneling instead of fully coherent tunneling. The theoretical framework of sequential tunneling is especially attractive since the admittance of the device can be obtained immediately. In order to complete this model we have investigated the frequency behavior of the charging and discharging phenomena in the quantum well. All geometric capacitances and the quantum capacitance [1] have been taken into account in this model.[2]
Keywords
Admittance; Diodes; Energy states; Frequency; Microelectronics; Quantum capacitance; Resonant tunneling devices; Sequential analysis; Solid modeling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location
Leuven, Belgium
Print_ISBN
0444894780
Type
conf
Filename
5435427
Link To Document