DocumentCode
1911176
Title
Time to Failure Behavior under a Stochastic Deterioration Model
Author
Xiang, Yisha ; Cassady, C.R.
fYear
2007
fDate
22-25 Jan. 2007
Firstpage
405
Lastpage
409
Abstract
The objective of our study is to investigate the potential for approximating the time to first failure distributions resulting from stochastic deterioration models with traditional time to failure distributions (e.g., the Weibull). We first constructed a discrete-event simulation model that mimics the stochastic deterioration and failure of the system of interest: a single-unit system subject to a random operating environment such that its instantaneous rate of degradation depends on the state of the environment. The state of the environment is modeled as a continuous-time Markov Chain. A methodology is then defined for fitting a traditional time to failure distribution to the simulated data. A large numerical experiment is used to evaluate the quality of this fit under a wide range of system parameters. The goodness-fit tests results show that a truncated, three-parameter Weibull distribution is a reasonable estimate for the case described in the paper.
Keywords
Markov processes; Weibull distribution; failure analysis; Weibull distribution; continuous-time Markov Chain; discrete-event simulation model; failure distributions; goodness-fit tests; stochastic deterioration model; time to failure behavior; Degradation; Job shop scheduling; Mathematical model; Physics; Predictive maintenance; Predictive models; Preventive maintenance; Sensor systems; Stochastic processes; Stochastic systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
0-7803-9766-5
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2007.328108
Filename
4126385
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