• DocumentCode
    1911176
  • Title

    Time to Failure Behavior under a Stochastic Deterioration Model

  • Author

    Xiang, Yisha ; Cassady, C.R.

  • fYear
    2007
  • fDate
    22-25 Jan. 2007
  • Firstpage
    405
  • Lastpage
    409
  • Abstract
    The objective of our study is to investigate the potential for approximating the time to first failure distributions resulting from stochastic deterioration models with traditional time to failure distributions (e.g., the Weibull). We first constructed a discrete-event simulation model that mimics the stochastic deterioration and failure of the system of interest: a single-unit system subject to a random operating environment such that its instantaneous rate of degradation depends on the state of the environment. The state of the environment is modeled as a continuous-time Markov Chain. A methodology is then defined for fitting a traditional time to failure distribution to the simulated data. A large numerical experiment is used to evaluate the quality of this fit under a wide range of system parameters. The goodness-fit tests results show that a truncated, three-parameter Weibull distribution is a reasonable estimate for the case described in the paper.
  • Keywords
    Markov processes; Weibull distribution; failure analysis; Weibull distribution; continuous-time Markov Chain; discrete-event simulation model; failure distributions; goodness-fit tests; stochastic deterioration model; time to failure behavior; Degradation; Job shop scheduling; Mathematical model; Physics; Predictive maintenance; Predictive models; Preventive maintenance; Sensor systems; Stochastic processes; Stochastic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-9766-5
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2007.328108
  • Filename
    4126385