• DocumentCode
    1911346
  • Title

    Embedded Instrumentation Systems Architecture

  • Author

    Visnevski, Nikita

  • Author_Institution
    Gen. Electr. Global Res. Center, Embedded Syst. Lab., Niskayuna, NY
  • fYear
    2008
  • fDate
    12-15 May 2008
  • Firstpage
    1134
  • Lastpage
    1139
  • Abstract
    The objective of the Embedded Instrumentation Systems Architecture (EISA) initiative is to develop a comprehensive methodology for large-scale, non-intrusive, flexible data collection for test and evaluation (T&E) needs. These needs include system-level developmental, operational, and continuous T&E. The architecture can also be useful in monitoring, diagnostics and health management, as well as protection in control applications. This paper briefly explains how EISA architecture offers a metadata driven methodology for heterogeneous data collection and aggregation in a synchronized and time-correlated fashion. It also supports real-time instrumentation and sensor management as well as virtual (synthetic) instrumentation.
  • Keywords
    automatic testing; condition monitoring; embedded systems; meta data; virtual instrumentation; EISA; condition monitoring; embedded instrumentation system architecture; health management; heterogeneous data collection; metadata; real-time instrumentation; sensor management; system-level development; test and evaluation; time-correlated fashion; virtual instrumentation; Data acquisition; Electronic equipment testing; Instruments; Intelligent sensors; Large-scale systems; Power system modeling; Protection; Sensor systems; System testing; Telemetry; Embedded instrumentation; IEEE 1451; IEEE 1588; non-intrusive instrumentation; smart sensor technology; synthetic instrumentation; systems architecture; virtual sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
  • Conference_Location
    Victoria, BC
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-1540-3
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2008.4547209
  • Filename
    4547209