DocumentCode
1911552
Title
EPIS (equipment and process information system) a new prospect of EDA and SPC system
Author
Chou, Chopin ; Yang, Ken ; Chiang, Gilbert ; Shiao, Robert
fYear
1998
fDate
16-17 Jun 1998
Firstpage
163
Lastpage
166
Abstract
EDA and SPC system technique had been widely used in semiconductor manufacturing industry for a long time. Those techniques can provide a statistical view of process control and a powerful tool for process improvement. However, it becomes more difficult to sustain the EDA and SPC system after the implementation of FAB automation due to the complication of the processes and the huge volume of data associated with it. Foundry fabs need to adapt to different processes and devices which made the job even more difficult. It is almost impossible for the engineer to analyze the huge amount of EDA and SPC data without a good tool. EPIS provides an effective tool for engineers to query, screen, correlate and analyze their SPC or EDA data, which will help the engineer to maintain process stability and troubleshooting
Keywords
electronic design automation; integrated circuit manufacture; statistical process control; EDA; EPIS; FAB automation; SPC system; equipment and process information system; process improvement; process stability; semiconductor manufacturing industry; Data engineering; Design engineering; Electronic design automation and methodology; Foundries; Graphical user interfaces; Information systems; Maintenance engineering; Programming profession; Systems engineering and theory; User interfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Technology Workshop, 1998
Conference_Location
Hsinchu
Print_ISBN
0-7803-5179-7
Type
conf
DOI
10.1109/SMTW.1998.722691
Filename
722691
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