• DocumentCode
    1911552
  • Title

    EPIS (equipment and process information system) a new prospect of EDA and SPC system

  • Author

    Chou, Chopin ; Yang, Ken ; Chiang, Gilbert ; Shiao, Robert

  • fYear
    1998
  • fDate
    16-17 Jun 1998
  • Firstpage
    163
  • Lastpage
    166
  • Abstract
    EDA and SPC system technique had been widely used in semiconductor manufacturing industry for a long time. Those techniques can provide a statistical view of process control and a powerful tool for process improvement. However, it becomes more difficult to sustain the EDA and SPC system after the implementation of FAB automation due to the complication of the processes and the huge volume of data associated with it. Foundry fabs need to adapt to different processes and devices which made the job even more difficult. It is almost impossible for the engineer to analyze the huge amount of EDA and SPC data without a good tool. EPIS provides an effective tool for engineers to query, screen, correlate and analyze their SPC or EDA data, which will help the engineer to maintain process stability and troubleshooting
  • Keywords
    electronic design automation; integrated circuit manufacture; statistical process control; EDA; EPIS; FAB automation; SPC system; equipment and process information system; process improvement; process stability; semiconductor manufacturing industry; Data engineering; Design engineering; Electronic design automation and methodology; Foundries; Graphical user interfaces; Information systems; Maintenance engineering; Programming profession; Systems engineering and theory; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop, 1998
  • Conference_Location
    Hsinchu
  • Print_ISBN
    0-7803-5179-7
  • Type

    conf

  • DOI
    10.1109/SMTW.1998.722691
  • Filename
    722691