DocumentCode
1911822
Title
Molecular orientation depth profiling of LC thin film under shear flow by near-field birefringence response
Author
Qin, Jing ; Umeda, Norihiro
Author_Institution
Fac. of Eng., Tokyo Univ. of Agric. & Technol., Koganei
fYear
2008
fDate
12-15 May 2008
Firstpage
1239
Lastpage
1242
Abstract
In this paper, homogenous alignment LC film and homeotropic alignment LC film which are mainly used in LC display devices were detected, and their molecular orientation distribution in depth direction were profiled layer by layer by using a novel method which can also be used to observe anchoring effect (anchoring extrapolation length) caused by alignment layer. Instead of the traditional method detecting LC bulk sandwiched by two alignment substrates with electrodes, here we used mechanical shear flow by vibrating fiber probe to reorientate the nematic LC molecules and measured their birefringence response to the reorientation in optical near-field. From the birefringence response, the director of molecules under fiber probe is observed, from which molecular orientation of LC thin film in depth direction can be modeled.
Keywords
birefringence; display devices; extrapolation; liquid crystals; shear flow; thin films; LC display devices; LC thin film; anchoring effect; anchoring extrapolation length; homeotropic alignment LC film; homogenous alignment LC film; mechanical shear flow; molecular orientation depth profiling; near-field birefringence response; Birefringence; Displays; Electrodes; Extrapolation; Fluid flow measurement; Image motion analysis; Mechanical variables measurement; Probes; Substrates; Transistors; Liquid Crystal; Shear flow; anchoring effect; birefringence; fiber probe; molecular orientation; scanning near-field optical microscope (SNOM);
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location
Victoria, BC
ISSN
1091-5281
Print_ISBN
978-1-4244-1540-3
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2008.4547231
Filename
4547231
Link To Document