• DocumentCode
    1913051
  • Title

    Improved Test Efficiency in Cores-Based System-on-Chips Using ModelSim Verification Tool

  • Author

    Das, Sunil R. ; Li, Jun Feng ; Hossain, Altaf ; Nayak, Amiya R. ; Petriu, Emil M. ; Biswas, Satyendra ; Jone, Wen Ben

  • Author_Institution
    Sch. of Inf. Technol. & Eng., Univ. of Ottawa, Ottawa, ON
  • fYear
    2008
  • fDate
    12-15 May 2008
  • Firstpage
    1487
  • Lastpage
    1492
  • Abstract
    Due to paradigm shift from system-on-board to designs embracing embedded cores-based system-on-chips (SOCs), the complexity of digital circuits has enormously increased in recent times. This growing complexity has created a huge challenge in developing their appropriate and efficient fault testing environment. Despite enormous efforts directed towards effective testing of very large scale integrated (VLSI) circuit chips with reasonable cost, new frontiers emerged with advances in technology. The subject paper plans to develop a method to test verify circuit architecture under a hardware software co-design environment, specifically targeting embedded cores-based system-on-chips (SOCs). The concept of design-for-testability (DFT) is utilized in the paper together with ModelSim simulation and verification tool to test simulate the entire design. Some simulation results on ISCAS 85 combinational benchmark circuits are also included with a comparison of the results with some earlier works.
  • Keywords
    built-in self test; design for testability; fault simulation; hardware-software codesign; logic design; logic testing; system-on-chip; ISCAS 85 combinational benchmark circuits; ModelSim verification tool; built-in self-test; design-for-testability; digital circuits; embedded core-based SOC; fault simulation; fault testing environment; hardware software co-design environment; large scale integrated circuit; system-on-chips; Circuit faults; Circuit simulation; Circuit testing; Costs; Digital circuits; Integrated circuit technology; Software testing; System testing; System-on-a-chip; Very large scale integration; Built-in self-test (BIST); Verilog HDL; embedded cores-based system-on-chips (SOCs); fault injection; fault simulation; module under test (MUT); test pattern generator (TPG);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
  • Conference_Location
    Victoria, BC
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-1540-3
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2008.4547278
  • Filename
    4547278