Thorough evaluation of Hot-Carrier Induced Degradation in Deep Submicron Thin-film UNIBOND and SIMOX N-MOSFETs

Author

Renn, S.H. ; Jomaah, J. ; Balestra, F. ; Raynaud, C.

Author_Institution

LPCS/ENSERG/INPG, Grenoble, France

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

252

Lastpage

255

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

Filename

1503536

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