DocumentCode
1914411
Title
Electron transport in CeOx -based resistive switching devices
Author
Miranda, E. ; Suñé, J. ; Kano, Shingo ; Dou, Chunyan ; Kakushima, K. ; Iwai, Hisato
Author_Institution
Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
fYear
2012
fDate
14-17 March 2012
Firstpage
1
Lastpage
4
Abstract
The electron transport in electroformed W/CeOx/SiO2/NiSi2 capacitors grown onto a p+-type Si substrate is investigated within the framework of the Landauer theory for mesoscopic systems. It is shown that the devices exhibit bipolar resistive switching with conductance levels in the low resistance state (LRS) of the order of integer and half integer values of the quantum conductance unit G0 = 2e2/h. This is consistent with the so-called nonlinear conduction regime in quantum point contacts. A simple model for the LRS I-V characteristics which accounts for the available right- and left-going conduction modes allowed by the constriction´s size and the voltage drop distribution along the filamentary path is presented.
Keywords
MIM devices; cerium compounds; electroforming; nickel compounds; semiconductor switches; silicon compounds; tungsten compounds; LRS I-V characteristics; Landauer theory; W-CeOx-SiO2-NiSi2; bipolar resistive switching; electroformed capacitor; electron transport; left-going conduction mode; low resistance state; mesoscopic system; metal-insulator-metal; nonlinear conduction regime; p+-type silicon substrate; quantum conductance unit; quantum point contact; resistive switching device; right-going conduction mode; voltage drop distribution; Electric potential; Electrodes; Metals; Silicon; Simulation; Substrates; Switches; MIM; dielectric breakdown; resistive switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Devices, Circuits and Systems (ICCDCS), 2012 8th International Caribbean Conference on
Conference_Location
Playa del Carmen
Print_ISBN
978-1-4577-1116-9
Electronic_ISBN
978-1-4577-1115-2
Type
conf
DOI
10.1109/ICCDCS.2012.6188928
Filename
6188928
Link To Document