• DocumentCode
    1914411
  • Title

    Electron transport in CeOx-based resistive switching devices

  • Author

    Miranda, E. ; Suñé, J. ; Kano, Shingo ; Dou, Chunyan ; Kakushima, K. ; Iwai, Hisato

  • Author_Institution
    Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
  • fYear
    2012
  • fDate
    14-17 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The electron transport in electroformed W/CeOx/SiO2/NiSi2 capacitors grown onto a p+-type Si substrate is investigated within the framework of the Landauer theory for mesoscopic systems. It is shown that the devices exhibit bipolar resistive switching with conductance levels in the low resistance state (LRS) of the order of integer and half integer values of the quantum conductance unit G0 = 2e2/h. This is consistent with the so-called nonlinear conduction regime in quantum point contacts. A simple model for the LRS I-V characteristics which accounts for the available right- and left-going conduction modes allowed by the constriction´s size and the voltage drop distribution along the filamentary path is presented.
  • Keywords
    MIM devices; cerium compounds; electroforming; nickel compounds; semiconductor switches; silicon compounds; tungsten compounds; LRS I-V characteristics; Landauer theory; W-CeOx-SiO2-NiSi2; bipolar resistive switching; electroformed capacitor; electron transport; left-going conduction mode; low resistance state; mesoscopic system; metal-insulator-metal; nonlinear conduction regime; p+-type silicon substrate; quantum conductance unit; quantum point contact; resistive switching device; right-going conduction mode; voltage drop distribution; Electric potential; Electrodes; Metals; Silicon; Simulation; Substrates; Switches; MIM; dielectric breakdown; resistive switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems (ICCDCS), 2012 8th International Caribbean Conference on
  • Conference_Location
    Playa del Carmen
  • Print_ISBN
    978-1-4577-1116-9
  • Electronic_ISBN
    978-1-4577-1115-2
  • Type

    conf

  • DOI
    10.1109/ICCDCS.2012.6188928
  • Filename
    6188928