• DocumentCode
    1914629
  • Title

    Electrostatic measurements on plastic webs

  • Author

    Durkin, William J.

  • Author_Institution
    Eastman Kodak Co., Rochester, NY, USA
  • fYear
    1993
  • fDate
    2-8 Oct 1993
  • Firstpage
    1728
  • Abstract
    It is pointed out that, when interpreting the results of electric fieldmeter measurements on webs, one must be very careful applying the assumption that the fieldmeter head, even with a ground plane attached, and the web approximate a pair of infinite parallel planes. As the web width increases well beyond the dimensions of the fieldmeter head, the assumption that the electric field measured by the head followed E =σ/∈0 becomes grossly in error. If this equation is used, the calculated charge density can be in error by a factor of three or four, although the error can be much greater than this for particular geometries that enable higher field concentration. Field-solver software is useful for finding a relationship between electric-field readings and the web charge density, especially in complex geometries. It gives the opportunity to separate the effects of geometry from the effects of charge transfer. This allows a better estimate of the charge density on webs and a better estimate of the electrostatic effects which might result from that charge. This leads to improved understanding of the electrostatic behavior of dielectric webs in real web paths
  • Keywords
    charge measurement; digital simulation; electric charge; electrical engineering computing; electrostatics; plastics; charge density; charge transfer; computer simulation; dielectric webs; electric fieldmeter measurements; electrostatic behavior; error; geometries; ground plane; infinite parallel planes; plastic webs; software; Charge measurement; Current measurement; Density measurement; Dielectric materials; Dielectric measurements; Electrostatic measurements; Geometry; Laboratories; Plastics; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
  • Conference_Location
    Toronto, Ont.
  • Print_ISBN
    0-7803-1462-X
  • Type

    conf

  • DOI
    10.1109/IAS.1993.299074
  • Filename
    299074