• DocumentCode
    1914687
  • Title

    Acceleration of IC verification process using advanced flexible modular measurement systems and software architectures

  • Author

    Pirker-Fruhauf, A. ; Gallent, Wolfgang ; Kunze, Matthias ; Pelz, Georg

  • Author_Institution
    KAI-Kompetenzzentrum Automobil- und Ind.-Elektron. GmbH, Villach
  • fYear
    2008
  • fDate
    12-15 May 2008
  • Firstpage
    1845
  • Lastpage
    1847
  • Abstract
    Test engineers use automated test systems in applications ranging from design validation to end-of-line production test with the aim of ensuring the quality and reliability of a product that reaches the end customer. As complexity of integrated circuits is exponentially growing and consequently the verification process time, the use of automated test systems to perform simple pass/fail tests or product characterization measurements have quickly become an even more important part of the product development process. This paper gives advise to develop test systems that lower cost, increase test throughput, and can scale with future requirements.
  • Keywords
    automatic test software; electronic engineering computing; integrated circuit design; integrated circuit testing; measurement systems; product development; production testing; IC verification process acceleration; automated test systems; end-of-line production test; flexible modular measurement systems; integrated circuits; product development; software architectures; Acceleration; Accelerometers; Automatic testing; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Reliability engineering; Software architecture; Software measurement; System testing; PXI; PXI switching; XML; XSLT;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
  • Conference_Location
    Victoria, BC
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-1540-3
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2008.4547345
  • Filename
    4547345