DocumentCode
1914687
Title
Acceleration of IC verification process using advanced flexible modular measurement systems and software architectures
Author
Pirker-Fruhauf, A. ; Gallent, Wolfgang ; Kunze, Matthias ; Pelz, Georg
Author_Institution
KAI-Kompetenzzentrum Automobil- und Ind.-Elektron. GmbH, Villach
fYear
2008
fDate
12-15 May 2008
Firstpage
1845
Lastpage
1847
Abstract
Test engineers use automated test systems in applications ranging from design validation to end-of-line production test with the aim of ensuring the quality and reliability of a product that reaches the end customer. As complexity of integrated circuits is exponentially growing and consequently the verification process time, the use of automated test systems to perform simple pass/fail tests or product characterization measurements have quickly become an even more important part of the product development process. This paper gives advise to develop test systems that lower cost, increase test throughput, and can scale with future requirements.
Keywords
automatic test software; electronic engineering computing; integrated circuit design; integrated circuit testing; measurement systems; product development; production testing; IC verification process acceleration; automated test systems; end-of-line production test; flexible modular measurement systems; integrated circuits; product development; software architectures; Acceleration; Accelerometers; Automatic testing; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Reliability engineering; Software architecture; Software measurement; System testing; PXI; PXI switching; XML; XSLT;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location
Victoria, BC
ISSN
1091-5281
Print_ISBN
978-1-4244-1540-3
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2008.4547345
Filename
4547345
Link To Document