Explanation of the "long distance" Vt roll-off in deep submicron nMOS transistors with Indium channel

Author

Kubicek, Stefan ; J.Lyu ; Meyer, Kristin De

Author_Institution

IMEC, Leuven, Belgium

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

368

Lastpage

371

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

Filename

1503565

Link To Document