Interconnect Characterization Flow for Minimal-Segment Model Selection

Author

Andersson, Daniel A. ; Svensson, Lars ; Larsson-Edefors, Per

Author_Institution

Dept. of Comput. Sci. & Eng., Chalmers Univ. of Technol., Goteborg

fYear

2006

fDate

Nov. 2006

Firstpage

53

Lastpage

58

Abstract

We present a new method to find minimal-complexity interconnect models that obey a certain specified accuracy in relation to the true waveform. The method can be described as an interconnect characterization flow that defines simple rules for finding the minimal number of segments and required segment type, RC or RLC, by regarding interconnect resistance, driver source resistance, interconnect characteristic impedance and load capacitance. To show the application of the method, segment selection rules are derived for a case with a waveform discrepancy constraint of 5%

Keywords

RLC circuits; integrated circuit interconnections; integrated circuit modelling; driver source resistance; interconnect characteristic impedance; interconnect characterization flow; interconnect resistance; load capacitance; minimal-complexity interconnect models; minimal-segment model selection; segment selection rules; waveform discrepancy constraint; Circuit simulation; Computer science; Delay; Distributed parameter circuits; Impedance; Integrated circuit interconnections; Predictive models; RLC circuits; Read only memory; Transmission lines;

fLanguage

English

Publisher

ieee

Conference_Titel

Norchip Conference, 2006. 24th

Conference_Location

Linkoping

Print_ISBN

1-4244-0772-9

Type

conf

DOI

10.1109/NORCHP.2006.329243

Filename

4126946