• DocumentCode
    1915760
  • Title

    Specific charge measurements in electrostatic air sprays

  • Author

    McCarthy, J.E., Jr. ; Senser, D.W.

  • Author_Institution
    Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1993
  • fDate
    2-8 Oct 1993
  • Firstpage
    1905
  • Abstract
    An experimental study of the effects of nozzle parameters and fluid properties on specific charge and ratio of ion to drop current for electrostatic air sprays is reported. The specific gun used and the parameter ranges investigated are characteristic of many industrial painting processes. A simple collector system that discriminates between drop and ion currents was used to measure ensemble-averaged specific charge for the drops and the ratio of ion to drop current. The data exhibit a coupled dependence on applied potential, liquid flow rate, atomizing air flow rate, and fluid properties. The trends are consistent with contact charging of the liquid and ion generation during breakup of the bulk liquid into drops. Specific charges range from 0 to 9 μC/g and the ratios of ion to drop currents range from 0 to 6. Analysis of the current ratios indicates that under many conditions the ion charge density near the substrate is small in comparison to the drop charge density. Consequently, the ion charge density may be neglected and only the drop charge density must be considered in simulating the electrostatic fields
  • Keywords
    charge measurement; nozzles; spray coating techniques; applied potential; atomizing air flow rate; drop charge density; electrostatic air sprays; fluid properties; industrial painting processes; ion to drop current ratio; liquid flow rate; nozzle parameters; specific charge measurements; Charge measurement; Current measurement; Electrostatic measurements; Fluid flow; Fluid flow control; Mechanical engineering; Paints; Propulsion; Thermal engineering; Thermal spraying;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
  • Conference_Location
    Toronto, Ont.
  • Print_ISBN
    0-7803-1462-X
  • Type

    conf

  • DOI
    10.1109/IAS.1993.299116
  • Filename
    299116