• DocumentCode
    1915763
  • Title

    Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors

  • Author

    Horstmann, J.T. ; Hilleringmann, U. ; Goser, K.

  • Author_Institution
    University of Dortmund, Germany
  • fYear
    1998
  • fDate
    8-10 Sept. 1998
  • Firstpage
    512
  • Lastpage
    515
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Conference_Location
    Bordeaux, France
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503601
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1915763