DocumentCode
1915999
Title
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
fYear
2001
fDate
24-26 Oct. 2001
Abstract
The following topics are dealt with:wafer scale; yield; dependable design; testing techniques; fault-tolerance in arrays; mixed signal circuits; defect analysis; self-checking and fail-safe circuits; and fault-tolerant techniques
Keywords
VLSI; fault diagnosis; fault tolerance; integrated circuit design; integrated circuit reliability; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; wafer-scale integration; defect analysis; design; fail-safe circuits; fault-tolerant techniques; mixed signal circuits; self-checking; testing techniques; wafer scale; yield;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location
San Francisco, CA, USA
ISSN
1550-5774
Print_ISBN
0-7695-1203-8
Type
conf
DOI
10.1109/DFTVS.2001.966745
Filename
966745
Link To Document